Technique of Cluster Analysis Application in Semiconductor Elements Classification for Improving Product Quality and Reliability

Mishanov, R. O.

Abstract. The text deals with the information about application of cluster analysis for the purpose of semiconductor elements classification. The technique of semiconductor elements classification on groups based on application of k-means clustering is offered. Using the offered technique the research of CMOS chips selection was conducted. A time delay on the leading edge of the signal and a critical voltage supply were used as informative parameters of the chips. The recommendations about application of this technique in case of large number of informative parameters are offered.

Keywords: cluster analysis, k-means clustering, cluster group, informative parameter, Euclidean distance, dendrogram

GOST 7.1-2003 citation for works in English:Цитирование по ГОСТ 7.1-2003 для работ на английском языке:
Mishanov, R. O. Technique of cluster analysis application in semiconductor elements classification for improving product quality and reliability // Instrumentation Engineering, Electronics and Telecommunications – 2016 : Proceedings of the II International Forum (Izhevsk, Russia, November 23–25, 2016). – Izhevsk : Publishing House of Kalashnikov ISTU, 2017. – Pp. 54–62.

GOST 7.1-2003 citation for works in Russian:Цитирование по ГОСТ 7.1-2003 для работ на русском языке:
Mishanov, R. O. Technique of cluster analysis application in semiconductor elements classification for improving product quality and reliability // Приборостроение, электроника и телекоммуникации – 2016 : Сб. ст. II Междунар. форума (г. Ижевск, 23–25 ноября 2016 г.). – Ижевск : Изд-во ИжГТУ имени М. Т. Калашникова, 2017. – С. 54–62.

APA v6 сitation:Цитирование в формате APA v6:
Mishanov, R. O. (2017). Technique of cluster analysis application in semiconductor elements classification for improving product quality and reliability. In Instrumentation Engineering, Electronics and Telecommunications – 2016. Proceedings of the II International Forum (pp. 54–62). Izhevsk, Russia : Publishing House of Kalashnikov ISTU.