Determination of Organic Contaminants Concentration on the Silica Surface by Lateral Force Microscopy

Ivliev, N., Kolpakov, V., Krichevskiy, S., Kazanskiy, N.

Abstract. We present a method for determining the concentration of organic contaminants on the silica surface by using lateral force maps and surface topology images obtained with scanning probe microscopy. In this study, we optimized the scanning frequency to increase image contrast and facilitate interpreting data obtained. We also proved experimentally that the sensitivity of the method reaches 10–11 g/cm².

Keywords: concentration of organic contaminants, surface, lateral force

GOST 7.1-2003 citation for works in English:Цитирование по ГОСТ 7.1-2003 для работ на английском языке:
Ivliev, N., Kolpakov, V., Krichevskiy, S., Kazanskiy, N. Determination of organic contaminants concentration on the silica surface by lateral force microscopy // Instrumentation Engineering, Electronics and Telecommunications – 2016 : Proceedings of the II International Forum (Izhevsk, Russia, November 23–25, 2016). – Izhevsk : Publishing House of Kalashnikov ISTU, 2017. – Pp. 34–41.

GOST 7.1-2003 citation for works in Russian:Цитирование по ГОСТ 7.1-2003 для работ на русском языке:
Ivliev, N., Kolpakov, V., Krichevskiy, S., Kazanskiy, N. Determination of organic contaminants concentration on the silica surface by lateral force microscopy // Приборостроение, электроника и телекоммуникации – 2016 : Сб. ст. II Междунар. форума (г. Ижевск, 23–25 ноября 2016 г.). – Ижевск : Изд-во ИжГТУ имени М. Т. Калашникова, 2017. – С. 34–41.

APA v6 сitation:Цитирование в формате APA v6:
Ivliev, N., Kolpakov, V., Krichevskiy, S., & Kazanskiy, N. (2017). Determination of organic contaminants concentration on the silica surface by lateral force microscopy. In Instrumentation Engineering, Electronics and Telecommunications – 2016. Proceedings of the II International Forum (pp. 34–41). Izhevsk, Russia : Publishing House of Kalashnikov ISTU.