IEET-2015

Forming the Panoramic SPM-Images Scans during Nanoparticles Dispersity

Gulyaev, P.V., Shelkovnikov, E.Yu., Tyurikov, A.V., Korshunov, A.I.

Abstract. The basic principles of particles detectors application, overlapped SPM-images binding programs, positioning devices and sensors for nanoparticles in the scanning probe microscopy research are described.

Keywords: scanning tunneling microscopy, coordinate binding, characteristic point of the image, basis function, image shift and angle of rotation